1.LTE test card, 4G test card, LTE-FDD card, LTE-TDD card, GSM test card, CDMA test card, UIM test card, RUIM test card, WCDMA mobile phone test, TD-SCDMA test card, CDMA2000 test card, and mobile phone test Card (also known as white card), used for signal testing in the communications industry (Long Term Evolution).It is a long-term evolution of the UMTS technology standard developed by the 3GPP organization. It started in the conference In December 2004 3GPP Toronto TSG RAN #26. The LTE system introduced key transmission technologies such as OFDM and multi-antenna MIMO, which significantly increased the spectrum efficiency and data transmission rate (peak rate can reach 50 Mbit/s upstream and 100 Mbit/s downstream), and supports multiple Bandwidth Allocation: 1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz and 20MHz, etc. The spectrum allocation is more flexible and the capacity and coverage of system are significantly improved. The LTE wireless network architecture is more flattened, which reduces the system delay and reduces the network construction cost, Maintenance cost: The LTE system supports interoperability with other 3GPP systems, FDD-LTE is 4G standard which abundant and most widely used in the countries and regions currently the world. ). It is commonly used in LTE mobile phones, 4G mobile phones, FDD mobile phones, GSM mobile phones, UIM mobile phones, RUIM mobile phones, CDMA2000 mobile phones, and USIM mobile phones, and is integrated with a comprehensive tester and a self-built network to perform comprehensive interference-free tests on mobile phones; It is commonly used in LTE mobile phones, 4G mobile phones, FDD mobile phones, GSM mobile phones, UIM mobile phones, RUIM mobile phones, CDMA2000 mobile phones, and USIM mobile phones, and is integrated with a comprehensive tester and a self-built network to perform comprehensive interference-free tests on mobile phones; To carry out relevant signal tests, usually need large screens , more manpower , material and testing time . This makes the production process complicated and costs increase. The test card can realize the unique path from the signal to the instrument to the mobile phone, making the test environment more concise. This is a good solution to this arduous problem. The test card can perform coupling test, bit error rate test, complete VCC and RSTB, and can be used for terminal and tester tests. 2. Workable with test equipment brand: Applicable to Agilent, Anritsu, Rohde & Schwarz, Star Point, AGILENT8960, ROHDE & SCHWARZ, SUNLIGHT, CMU200, CMU55, E5515C, E8285A, MT8820A, NOISEKEN, FLUKE, TEKTRONIC, ADVANTES and other foreign and domestic testing instruments and The self-built networks of handset manufacturers or operators. 3: product quality assurance: Our LTE test card, 4G test card, LTE-FDD card, LTE-TDD card, test card, GSM test card, CDMA test card, UIM test card, RUIM test card, WCDMA mobile phone test, TD-SCDMA test card, CDMA2000 test card and mobile phone test card adopt special chip produced by internationally renowned semiconductor manufacturers, 3V/5V compatible 5-6 contact compatible design, suitable for all mobile phones, with dedicated COS system, fully comply with 4G mobile phone, 3G mobile phone, 2G For mobile phones, etc., the specification of our test card has a special semiconductor silicon liner to ensure that the card can be withstand the pressure of 10 newton per square meter. (The GSM standard is 4 newton per square meter.) It is suitable for use in industrialized production lines. Our test card uses ultra-long-life EEPROM to ensure t reads and writes more than 100,000 times. (The 3G standard only requires 30,000 times. Generally, the products line usually request reading/writing 10 times and can be test 10000 mobile phones.) patented chip protection layer to ensure card security and prevent electronic attacks. Our test card Withstanding voltage above 6.5V and with special card coating, antistatic (ESD), waterproof (48 hours immersion test) special card body material (ABS mixed high temperature PVC), high temperature resistance, can work in 45 degrees for more than 4 hours. Passed 75 degree temperature impact test. Our SIM testing cards are authorized by the National IC Card Registration Center and the cards use Samsung, Hitachi, Philips and other chips. The physical characteristics, chemical resistance, and contact electrical characteristics of all SIM smart cards have passed the inspection of the National Computer Quality Supervision and Inspection Center and the IC Card Quality Supervision and Inspection Center of the Ministry of Information Industry, with authoritative quality assurance.